Publication detail
Automatic test-bench for SiC power devices using LabVIEW
Authors:
Leuchter Jan | Pham Ngoc Nam | Nguyen Huy Hoang
Year: 2024
Type of publication: článek v odborném periodiku
Name of source: Journal of Electrical Engineering
Publisher name: Slovenská technická univerzita v Bratislave
Place: Bratislava
Page from-to: 77-85